Gurunadha.Ravva, K.Babulu and P.Srinivasa rao
Jawaharlal Nehru Technological University, India

In this paper methods for testing both software and hardware faults are implemented in analog and digital signal circuits are presented. They are based on the wavelet transform (WT). The limit which affected by faults detect ability, for the reference circuits is set by statistical processing data obtained from a set of faults free circuits .In wavelet analysis it has two algorithm one is based on a discrimination factor using Euclidean distances and the other mahalanobis distances, are introduced both methods on wavelet energy calculation. Simulation result from proposed test methods in the testing known analog and digital signal circuit benchmark are given. The results shows that effectiveness of existing methods two test metrics against three other test methods, namely a test method based on rms value of the measured signal, a test method utilizing the harmonic magnitude component of the measured signal waveform.

Faults dectection, simulation distance measurement eudiean distance and mahanolobis distance,