Gurunadha.Ravva and K.Babulu
Jawaharlal Nehru Technological University, Vijayanagaram, India

In this paper a simple shortcoming model for a CMOS exchanged capacitor low pass channel is tried. Theexchanged capacitor (SC) low pass channel circuit is modularized into practical macros. These useful macros incorporate OPAMP, switches and capacitors. The circuit is distinguished as flawed if the recurrence reaction of the exchange capacity does not meet the configuration detail. The sign stream chart (SFG) models of the considerable number of macros are investigated to get the broken exchange capacityof the circuit under test (CUT). A CMOS exchanged capacitor low pass channel for sign recipient applications is picked as a case to exhibit the testing of the simple shortcoming model. To find out error is to calculate EIGEN values and EIGEN vectors is to detect the error of each component and parameters